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Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials (2nd edition)

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Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp - Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (2nd edition)
Published: 2010-09-07 | ISBN: 3642024165, 3642264786 | PDF | 258 pages | 4.95 MB

This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.




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